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Determination of the Number of Graphene Layers on Different Substrates by Optical Microscopy Technique

Fuente: Redalyc

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Detalles Bibliográficos
Autor principal:	F. Obelenis
Formato:	Artículo científico
Lenguaje:	en
Publicado:	Sociedade Brasileira de Física 2014
Materias:	Física, Astronomía y Matemáticas AFM Graphene Opticalmicroscopy
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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