Modeling Chaotic Current Oscillations in Semi-Insulating GaAs with Rate-Equations of Impact Ionization and Field-Enhanced Trapping

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Bibliographic Details
Main Author:	H.A. Albuquerque
Format:	Artículo científico
Language:	en
Published:	Sociedade Brasileira de Física 2006
Subjects:	Física, Astronomía y Matemáticas generation bifurcation diagrams recombination processes current oscillations in semiconductors
Online Access:	Acceder al recurso
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