Characterization of CdTe Thin Films Grown on Glass by Hot Wall Epitaxy
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| Format: | Artículo científico |
| Langue: | en |
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Sociedade Brasileira de Física
2006
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| _version_ | 1876470006294773760 |
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| author | Sukarno Olavo Ferreira |
| author_facet | Sukarno Olavo Ferreira |
| contents | Characterization of CdTe Thin Films Grown on Glass by Hot Wall Epitaxy Sukarno Olavo Ferreira Fábio Fagundes Fagundes Leal Tatiana Estorani de Faria Jose Eduardo de Oliveira Paulo Motisuke Eduardo Abramof Física, Astronomía y Matemáticas CdTe Thin films grown Hot wall epitaxy In this work we have investigated the properties of CdTe thin films grown on glass substrates by Hot WallEpitaxy. Its most important feature is the growth at very low temperatures, which would allow the growth evenon polymer substrates. Our samples were grown at temperatures between 150 and 250 oC at a growth ratebetween 0.2 and 2 µm/h. The CdTe films were characterized by x-ray diffraction, scanning electron microscopyand optical transmission. The x-ray teta-2teta scans revealed films with cubic structure and a very high degreeof preferential orientation. In fact, for films thicker than 1 µm, no other reflections have been observed on thespectra besides the (111), (333) and (444). The scanning electron micrographs showed a grain size about 0.3µm and the optical transmission indicated a very good optical quality of the interfaces, showing pronouncedinterference fringes 2006 artículo científico 0103-9733 https://www.redalyc.org/articulo.oa?id=46436322 en http://www.redalyc.org/revista.oa?id=464 Brazilian Journal of Physics application/pdf Sociedade Brasileira de Física Brazilian Journal of Physics (Brasil) Num.2A Vol.36 |
| format | Artículo científico |
| id | redalyc_46436322 |
| institution | Redalyc |
| language | en |
| publishDate | 2006 |
| publisher | Sociedade Brasileira de Física |
| spellingShingle | Characterization of CdTe Thin Films Grown on Glass by Hot Wall Epitaxy Sukarno Olavo Ferreira Física, Astronomía y Matemáticas CdTe Thin films grown Hot wall epitaxy Characterization of CdTe Thin Films Grown on Glass by Hot Wall Epitaxy Sukarno Olavo Ferreira Fábio Fagundes Fagundes Leal Tatiana Estorani de Faria Jose Eduardo de Oliveira Paulo Motisuke Eduardo Abramof Física, Astronomía y Matemáticas CdTe Thin films grown Hot wall epitaxy In this work we have investigated the properties of CdTe thin films grown on glass substrates by Hot WallEpitaxy. Its most important feature is the growth at very low temperatures, which would allow the growth evenon polymer substrates. Our samples were grown at temperatures between 150 and 250 oC at a growth ratebetween 0.2 and 2 µm/h. The CdTe films were characterized by x-ray diffraction, scanning electron microscopyand optical transmission. The x-ray teta-2teta scans revealed films with cubic structure and a very high degreeof preferential orientation. In fact, for films thicker than 1 µm, no other reflections have been observed on thespectra besides the (111), (333) and (444). The scanning electron micrographs showed a grain size about 0.3µm and the optical transmission indicated a very good optical quality of the interfaces, showing pronouncedinterference fringes 2006 artículo científico 0103-9733 https://www.redalyc.org/articulo.oa?id=46436322 en http://www.redalyc.org/revista.oa?id=464 Brazilian Journal of Physics application/pdf Sociedade Brasileira de Física Brazilian Journal of Physics (Brasil) Num.2A Vol.36 |
| title | Characterization of CdTe Thin Films Grown on Glass by Hot Wall Epitaxy |
| topic | Física, Astronomía y Matemáticas CdTe Thin films grown Hot wall epitaxy |
| url | https://www.redalyc.org/articulo.oa?id=46436322 |