Influence of the Substrate Bias Voltage on the Crystallographic Structure and Surface Composition of Ti6A14V Thin Films Deposited by rf Magnetron Sputtering
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| Format: | Artículo científico |
| Language: | en |
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Sociedade Brasileira de Física
2006
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| _version_ | 1866811728382132224 |
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| author | J. F. Marco |
| author_facet | J. F. Marco |
| contents | Influence of the Substrate Bias Voltage on the Crystallographic Structure and Surface Composition of Ti6A14V Thin Films Deposited by rf Magnetron Sputtering J. F. Marco J. E. Alfonso J. Torres Física, Astronomía y Matemáticas Bias Steel Sputtering Ti6Al4V thin films prepared by rf magnetron sputtering were studied. Samples were grown onto two differenttypes of substrates: AISI 420 steel and common glass using a Ti6Al4V (99.9 %) target. Substrate biaswas varied from 100V to 200 V. Samples were characterized by X-ray diffraction (XRD), Energy DispersiveX-ray Analysis (EDX), Scanning Electron Microscopy (SEM), and X-Ray Photoelectron Spectroscopy (XPS).It was observed that the increase of the substrate voltage improved the crystallinity of the deposited films. Thestoichiometry of the deposited thin films was studied by EDX and found to be slightly different from that ofthe target material. Finally, the passive film spontaneously formed on the deposited films upon exposure tothe laboratory atmosphere was studied by XPS. The composition of the passive film is rather complex since itcontains several forms of oxidized titanium and vanadium as well as Al2O3. 2006 artículo científico 0103-9733 https://www.redalyc.org/articulo.oa?id=46436552 en http://www.redalyc.org/revista.oa?id=464 Brazilian Journal of Physics application/pdf Sociedade Brasileira de Física Brazilian Journal of Physics (Brasil) Num.3B Vol.36 |
| format | Artículo científico |
| id | redalyc_46436552 |
| language | en |
| publishDate | 2006 |
| publisher | Sociedade Brasileira de Física |
| spellingShingle | Influence of the Substrate Bias Voltage on the Crystallographic Structure and Surface Composition of Ti6A14V Thin Films Deposited by rf Magnetron Sputtering J. F. Marco Física, Astronomía y Matemáticas Bias Steel Sputtering Influence of the Substrate Bias Voltage on the Crystallographic Structure and Surface Composition of Ti6A14V Thin Films Deposited by rf Magnetron Sputtering J. F. Marco J. E. Alfonso J. Torres Física, Astronomía y Matemáticas Bias Steel Sputtering Ti6Al4V thin films prepared by rf magnetron sputtering were studied. Samples were grown onto two differenttypes of substrates: AISI 420 steel and common glass using a Ti6Al4V (99.9 %) target. Substrate biaswas varied from 100V to 200 V. Samples were characterized by X-ray diffraction (XRD), Energy DispersiveX-ray Analysis (EDX), Scanning Electron Microscopy (SEM), and X-Ray Photoelectron Spectroscopy (XPS).It was observed that the increase of the substrate voltage improved the crystallinity of the deposited films. Thestoichiometry of the deposited thin films was studied by EDX and found to be slightly different from that ofthe target material. Finally, the passive film spontaneously formed on the deposited films upon exposure tothe laboratory atmosphere was studied by XPS. The composition of the passive film is rather complex since itcontains several forms of oxidized titanium and vanadium as well as Al2O3. 2006 artículo científico 0103-9733 https://www.redalyc.org/articulo.oa?id=46436552 en http://www.redalyc.org/revista.oa?id=464 Brazilian Journal of Physics application/pdf Sociedade Brasileira de Física Brazilian Journal of Physics (Brasil) Num.3B Vol.36 |
| title | Influence of the Substrate Bias Voltage on the Crystallographic Structure and Surface Composition of Ti6A14V Thin Films Deposited by rf Magnetron Sputtering |
| topic | Física, Astronomía y Matemáticas Bias Steel Sputtering |
| url | https://www.redalyc.org/articulo.oa?id=46436552 |