Influence of the Current Density and Resistivity on the Optical Properties of P-Type Porous Silicon Thin Films Fabricated by the Electrochemical Anodizing Method

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1. Verfasser: F. Castillejo
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Veröffentlicht: Sociedade Brasileira de Física 2006
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author F. Castillejo
author_facet F. Castillejo
contents Influence of the Current Density and Resistivity on the Optical Properties of P-Type Porous Silicon Thin Films Fabricated by the Electrochemical Anodizing Method F. Castillejo J. Torres J. E. Alfonso Física, Astronomía y Matemáticas Reflectance Porous silicon Photoluminescence Optical properties Optical absorption Porous Silicon thin films were produced in this work by the electrochemical anodizing method. The sampleswere fabricated anodizing p type Si substrates with different resistivities in hydrofluoric acid. Samples wereprepared at different current densities. The films were characterized through reflectance and room photoluminescence(PL) measurements in the visible region. A simple theoretical model is proposed to calculate theOptical constants of the material using a theoretical simulation of the reflectance spectra. The maximum positionsof PL signals are shifted to long wavelengths as the porosity increase in samples prepared with substratesof resistivities of 0.1 and 1 W-cm, while an opposite behaviour is observed in samples prepared on more dopedsubstrates. The optical constants obtained through the calculation are the spectral variation of the refractiveindex and extinction coefficient, also are obtained the sample thickness and surface roughness. 2006 artículo científico 0103-9733 https://www.redalyc.org/articulo.oa?id=46436559 en http://www.redalyc.org/revista.oa?id=464 Brazilian Journal of Physics application/pdf Sociedade Brasileira de Física Brazilian Journal of Physics (Brasil) Num.3B Vol.36
format Artículo científico
id redalyc_46436559
institution Redalyc
language en
publishDate 2006
publisher Sociedade Brasileira de Física
spellingShingle Influence of the Current Density and Resistivity on the Optical Properties of P-Type Porous Silicon Thin Films Fabricated by the Electrochemical Anodizing Method
F. Castillejo
Física, Astronomía y Matemáticas
Reflectance
Porous silicon
Photoluminescence
Optical properties
Optical absorption
Influence of the Current Density and Resistivity on the Optical Properties of P-Type Porous Silicon Thin Films Fabricated by the Electrochemical Anodizing Method F. Castillejo J. Torres J. E. Alfonso Física, Astronomía y Matemáticas Reflectance Porous silicon Photoluminescence Optical properties Optical absorption Porous Silicon thin films were produced in this work by the electrochemical anodizing method. The sampleswere fabricated anodizing p type Si substrates with different resistivities in hydrofluoric acid. Samples wereprepared at different current densities. The films were characterized through reflectance and room photoluminescence(PL) measurements in the visible region. A simple theoretical model is proposed to calculate theOptical constants of the material using a theoretical simulation of the reflectance spectra. The maximum positionsof PL signals are shifted to long wavelengths as the porosity increase in samples prepared with substratesof resistivities of 0.1 and 1 W-cm, while an opposite behaviour is observed in samples prepared on more dopedsubstrates. The optical constants obtained through the calculation are the spectral variation of the refractiveindex and extinction coefficient, also are obtained the sample thickness and surface roughness. 2006 artículo científico 0103-9733 https://www.redalyc.org/articulo.oa?id=46436559 en http://www.redalyc.org/revista.oa?id=464 Brazilian Journal of Physics application/pdf Sociedade Brasileira de Física Brazilian Journal of Physics (Brasil) Num.3B Vol.36
title Influence of the Current Density and Resistivity on the Optical Properties of P-Type Porous Silicon Thin Films Fabricated by the Electrochemical Anodizing Method
topic Física, Astronomía y Matemáticas
Reflectance
Porous silicon
Photoluminescence
Optical properties
Optical absorption
url https://www.redalyc.org/articulo.oa?id=46436559