On the thickness measurement of metallic thin films

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Bibliographische Detailangaben
1. Verfasser:	A. I. Oliva
Format:	Artículo científico
Sprache:	en
Veröffentlicht:	Universidad Autónoma de Yucatán 2006
Schlagworte:	Computación film thickness metallic thin films electrical resistance
Online-Zugang:	Acceder al recurso
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

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