PRINCIPAL FACTORS DETERMINATION IN THE GROWTH OF THIN FILMS USING TAGUCHI'S TECHNIQUE

Fuente: Redalyc
Saved in:
Bibliographic Details
Main Author: E. R. Vázquez-Cerón
Format: Artículo científico
Language:en
Published: Universidad Nacional Autónoma de México 2007
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1876481336347197440
author E. R. Vázquez-Cerón
author_facet E. R. Vázquez-Cerón
contents PRINCIPAL FACTORS DETERMINATION IN THE GROWTH OF THIN FILMS USING TAGUCHI'S TECHNIQUE E. R. Vázquez-Cerón V. R. Barrales-Guadarrama E. M. Rodríguez-Rodríguez R. Barrales-Guadarrama Ingeniería A methodology to improve the production and quality of deposited thin films has been developed for the PLD technique. The main purpose is the optimization of electrical and transport properties of the films through the characterization of growth parameters concerning some important characteristics of the material such as roughness, resistance, homogeneity, etc. It improves the production process of thin films, and it also decreases costs, conserving the quality at the same time. The use of interpolations and orthogona arrangements allows to evaluate the growth parameters and to predict results eliminating the need to repeat experiments. 2007 artículo científico 1665-6423 https://www.redalyc.org/articulo.oa?id=47411543005 en http://www.redalyc.org/revista.oa?id=474 Journal of Applied Research and Technology application/pdf Universidad Nacional Autónoma de México Journal of Applied Research and Technology (México) Num.2 Vol.5
format Artículo científico
id redalyc_47411543005
institution Redalyc
language en
publishDate 2007
publisher Universidad Nacional Autónoma de México
spellingShingle PRINCIPAL FACTORS DETERMINATION IN THE GROWTH OF THIN FILMS USING TAGUCHI'S TECHNIQUE
E. R. Vázquez-Cerón
Ingeniería
PRINCIPAL FACTORS DETERMINATION IN THE GROWTH OF THIN FILMS USING TAGUCHI'S TECHNIQUE E. R. Vázquez-Cerón V. R. Barrales-Guadarrama E. M. Rodríguez-Rodríguez R. Barrales-Guadarrama Ingeniería A methodology to improve the production and quality of deposited thin films has been developed for the PLD technique. The main purpose is the optimization of electrical and transport properties of the films through the characterization of growth parameters concerning some important characteristics of the material such as roughness, resistance, homogeneity, etc. It improves the production process of thin films, and it also decreases costs, conserving the quality at the same time. The use of interpolations and orthogona arrangements allows to evaluate the growth parameters and to predict results eliminating the need to repeat experiments. 2007 artículo científico 1665-6423 https://www.redalyc.org/articulo.oa?id=47411543005 en http://www.redalyc.org/revista.oa?id=474 Journal of Applied Research and Technology application/pdf Universidad Nacional Autónoma de México Journal of Applied Research and Technology (México) Num.2 Vol.5
title PRINCIPAL FACTORS DETERMINATION IN THE GROWTH OF THIN FILMS USING TAGUCHI'S TECHNIQUE
topic Ingeniería
url https://www.redalyc.org/articulo.oa?id=47411543005