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Enhanced RF Characteristics of a 0.5 μm High Voltage nMOSFET (HVMOS) in a Standard CMOS Technology

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Détails bibliographiques
Auteur principal:	H. J. Saavedra-Gómez
Format:	Artículo científico
Langue:	en
Publié:	Universidad Nacional Autónoma de México 2014
Sujets:	Ingeniería HVMOS MOSFET High Breakdown
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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