Characterization of Thin Films Deposited by Physical Vapor Deposition (PVD), Using Electrochemical Impedance Spectroscopy (EIS) Technique

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Bibliographic Details
Main Author:	Jorge Morales Hernández
Format:	Artículo científico
Language:	en
Published:	Sociedad Química de México 2015
Subjects:	Multidisciplinaria (Ciencias Naturales y Exactas) PVD Corrosion Thin films nanodefects DC sputtering
Online Access:	Acceder al recurso
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