Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques
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Universidad Nacional de Colombia
2016
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| author | John Deiver Bonilla-Jaimes |
| author_facet | John Deiver Bonilla-Jaimes |
| contents | Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques John Deiver Bonilla-Jaimes Jose Antonio Henao-Martínez Carolina Mendoza-Luna Oscar Mauricio Castellanos-Alarcón Carlos Alberto Ríos-Reyes Ingeniería garnet micro X mineral ray diffraction analytical techniques By using the X-ray powder diffraction (XRPD) micro X-rays diffraction (μXRD) and scanning electron microscopy, the structural characterization of minerals is far more reliable and accurate. The identification and elemental and compositional quantification of minerals by these non-destructive techniques improve the quality of the results and allow a full analysis of the material. The data obtained by these techniques revealed the presence of garnet-type spessartine, in addition to trace elements and compounds that form the overall material. The structural refinement of spessartine was performed using the Rietveld method from data obtained by conventional diffraction and by using the MDI RIQAS analysis software. With the data acquired by μXRD using an area detector, a shorter exposure time (compared to that required by the 0L and 1D detectors) was achieved, and there was no need for particle size reduction of the mineral. It was also possible to identify the spessartine and other compounds in smaller concentrations (in situ measurements). By combining scanning electron microscopy and X-ray diffraction techniques, both worked from a characterization point of view. The examination by micro X-ray diffraction did not require physical separation of the sample. Using this information and the above advanced analytical techniques, the identification of garnet can be undertaken much more reliably. 2016 artículo científico 0012-7353 https://www.redalyc.org/articulo.oa?id=49644128011 en http://www.redalyc.org/revista.oa?id=496 Dyna application/pdf Universidad Nacional de Colombia Dyna (Colombia) Num.195 Vol.83 |
| format | Artículo científico |
| id | redalyc_49644128011 |
| institution | Redalyc |
| language | en |
| publishDate | 2016 |
| publisher | Universidad Nacional de Colombia |
| spellingShingle | Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques John Deiver Bonilla-Jaimes Ingeniería garnet micro X mineral ray diffraction analytical techniques Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques John Deiver Bonilla-Jaimes Jose Antonio Henao-Martínez Carolina Mendoza-Luna Oscar Mauricio Castellanos-Alarcón Carlos Alberto Ríos-Reyes Ingeniería garnet micro X mineral ray diffraction analytical techniques By using the X-ray powder diffraction (XRPD) micro X-rays diffraction (μXRD) and scanning electron microscopy, the structural characterization of minerals is far more reliable and accurate. The identification and elemental and compositional quantification of minerals by these non-destructive techniques improve the quality of the results and allow a full analysis of the material. The data obtained by these techniques revealed the presence of garnet-type spessartine, in addition to trace elements and compounds that form the overall material. The structural refinement of spessartine was performed using the Rietveld method from data obtained by conventional diffraction and by using the MDI RIQAS analysis software. With the data acquired by μXRD using an area detector, a shorter exposure time (compared to that required by the 0L and 1D detectors) was achieved, and there was no need for particle size reduction of the mineral. It was also possible to identify the spessartine and other compounds in smaller concentrations (in situ measurements). By combining scanning electron microscopy and X-ray diffraction techniques, both worked from a characterization point of view. The examination by micro X-ray diffraction did not require physical separation of the sample. Using this information and the above advanced analytical techniques, the identification of garnet can be undertaken much more reliably. 2016 artículo científico 0012-7353 https://www.redalyc.org/articulo.oa?id=49644128011 en http://www.redalyc.org/revista.oa?id=496 Dyna application/pdf Universidad Nacional de Colombia Dyna (Colombia) Num.195 Vol.83 |
| title | Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques |
| topic | Ingeniería garnet micro X mineral ray diffraction analytical techniques |
| url | https://www.redalyc.org/articulo.oa?id=49644128011 |