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Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques

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Detalles Bibliográficos
Autor principal:	John Deiver Bonilla-Jaimes
Formato:	Artículo científico
Lenguaje:	en
Publicado:	Universidad Nacional de Colombia 2016
Materias:	Ingeniería garnet micro X mineral ray diffraction analytical techniques
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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