Non-destructive measurement of the dielectric constant of solid samples
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| Format: | Artículo científico |
| Sprache: | en |
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Sociedad Mexicana de Física A.C.
2009
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| _version_ | 1876423655733329920 |
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| author | A. Guadarrama-Santana |
| author_facet | A. Guadarrama-Santana |
| contents | Non-destructive measurement of the dielectric constant of solid samples A. Guadarrama-Santana A. García-Valenzuela Física, Astronomía y Matemáticas pointer electrode dielectric constant Capacitance measurements materials characterization We discuss and analyze a practical methodology for the determination of the dielectric constant of a macroscopic solid sample in a nondestructive way. The technique consists in measuring the capacitance between a pointer electrode and the dielectric surface as a function of the separation distance in a scale comparable to the radius of curvature of the tip's apex. The changes in capacitance that must be measured will commonly be in the atto-farad scale and require specialized instrumentation which we also describe here. The technique requires two calibration standards and the sample needs to have a portion of its surface flat and some minimum dimensions, but otherwise it can have an arbitrary shape. We used a simple model based on the method of images to explain the methodology and present experimental results with the proposed methodology. 2009 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57013233012 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.6 Vol.55 |
| format | Artículo científico |
| id | redalyc_57013233012 |
| institution | Redalyc |
| language | en |
| publishDate | 2009 |
| publisher | Sociedad Mexicana de Física A.C. |
| spellingShingle | Non-destructive measurement of the dielectric constant of solid samples A. Guadarrama-Santana Física, Astronomía y Matemáticas pointer electrode dielectric constant Capacitance measurements materials characterization Non-destructive measurement of the dielectric constant of solid samples A. Guadarrama-Santana A. García-Valenzuela Física, Astronomía y Matemáticas pointer electrode dielectric constant Capacitance measurements materials characterization We discuss and analyze a practical methodology for the determination of the dielectric constant of a macroscopic solid sample in a nondestructive way. The technique consists in measuring the capacitance between a pointer electrode and the dielectric surface as a function of the separation distance in a scale comparable to the radius of curvature of the tip's apex. The changes in capacitance that must be measured will commonly be in the atto-farad scale and require specialized instrumentation which we also describe here. The technique requires two calibration standards and the sample needs to have a portion of its surface flat and some minimum dimensions, but otherwise it can have an arbitrary shape. We used a simple model based on the method of images to explain the methodology and present experimental results with the proposed methodology. 2009 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57013233012 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.6 Vol.55 |
| title | Non-destructive measurement of the dielectric constant of solid samples |
| topic | Física, Astronomía y Matemáticas pointer electrode dielectric constant Capacitance measurements materials characterization |
| url | https://www.redalyc.org/articulo.oa?id=57013233012 |