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Multipactor suppressing titanium nitride thin films analyzed through XPS and AES

Fuente: Redalyc

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Détails bibliographiques
Auteur principal:	M. Castro-Colin
Format:	Artículo científico
Langue:	en
Publié:	Sociedad Mexicana de Física A.C. 2008
Sujets:	Física, Astronomía y Matemáticas XPS AES Thin film multipactor anodization
Accès en ligne:	Acceder al recurso
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