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| Format: | Artículo científico |
| Language: | en |
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Sociedad Mexicana de Física A.C.
2011
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| Online Access: | https://www.redalyc.org/articulo.oa?id=57021213008 |
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| _version_ | 1866814310246776832 |
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| author | A. Martínez |
| author_facet | A. Martínez |
| contents | Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry A. Martínez J.A. Rayas R. Cordero F. Labbe Física, Astronomía y Matemáticas strain shearography Electronic speckle pattern interferometry In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in-plane strains induced on a composite sample. First, in-plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Next, we applied ESPSI to measure the derivative of in-plane surface displacements (the strains). The experimental results obtained by applying both techniques (ESPI and ESPSI) were compared. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured using an additional method. Once calibrated the system ESPSI, the ESPI could no longer be used. The strain field obtained in ESPSI is corrected by the sum of constant value calculated. 2011 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57021213008 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.6 Vol.57 |
| format | Artículo científico |
| id | redalyc_57021213008 |
| language | en |
| publishDate | 2011 |
| publisher | Sociedad Mexicana de Física A.C. |
| spellingShingle | Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry A. Martínez Física, Astronomía y Matemáticas strain shearography Electronic speckle pattern interferometry Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry A. Martínez J.A. Rayas R. Cordero F. Labbe Física, Astronomía y Matemáticas strain shearography Electronic speckle pattern interferometry In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in-plane strains induced on a composite sample. First, in-plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Next, we applied ESPSI to measure the derivative of in-plane surface displacements (the strains). The experimental results obtained by applying both techniques (ESPI and ESPSI) were compared. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured using an additional method. Once calibrated the system ESPSI, the ESPI could no longer be used. The strain field obtained in ESPSI is corrected by the sum of constant value calculated. 2011 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57021213008 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.6 Vol.57 |
| title | Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry |
| topic | Física, Astronomía y Matemáticas strain shearography Electronic speckle pattern interferometry |
| url | https://www.redalyc.org/articulo.oa?id=57021213008 |