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Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry

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Détails bibliographiques
Auteur principal:	A. Martínez
Format:	Artículo científico
Langue:	en
Publié:	Sociedad Mexicana de Física A.C. 2011
Sujets:	Física, Astronomía y Matemáticas strain shearography Electronic speckle pattern interferometry
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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