Electrical characterization of planarized a-SiGe:H Thin-film Transistors

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1. Verfasser: M. Dominguez
Format: Artículo científico
Sprache:en
Veröffentlicht: Sociedad Mexicana de Física A.C. 2013
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_version_ 1876489959519551488
author M. Dominguez
author_facet M. Dominguez
contents Electrical characterization of planarized a-SiGe:H Thin-film Transistors M. Dominguez P. Rosales A. Torresa Física, Astronomía y Matemáticas low Thin spin spice on glass In this work the electrical characterization of n-channel a-SiGe:H TFTs with planarized gate electrode is presented. The planarized a-SiGe:H TFTs were fabricated at 200±C on corning glass substrate. The devices exhibit a subthreshold slope of 0.56 V/Decade, an on/off-current ratio approximately of 106 and off-current approximately of 0.3£10¡12 A. The results show an improvement of the electrical characteristics when are compared to those unplanarized devices fabricated at higher temperature. Moreover, the simulation of the device using a SPICE model is presented. 2013 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57025669010 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.1 Vol.59
format Artículo científico
id redalyc_57025669010
institution Redalyc
language en
publishDate 2013
publisher Sociedad Mexicana de Física A.C.
spellingShingle Electrical characterization of planarized a-SiGe:H Thin-film Transistors
M. Dominguez
Física, Astronomía y Matemáticas
low
Thin
spin
spice
on glass
Electrical characterization of planarized a-SiGe:H Thin-film Transistors M. Dominguez P. Rosales A. Torresa Física, Astronomía y Matemáticas low Thin spin spice on glass In this work the electrical characterization of n-channel a-SiGe:H TFTs with planarized gate electrode is presented. The planarized a-SiGe:H TFTs were fabricated at 200±C on corning glass substrate. The devices exhibit a subthreshold slope of 0.56 V/Decade, an on/off-current ratio approximately of 106 and off-current approximately of 0.3£10¡12 A. The results show an improvement of the electrical characteristics when are compared to those unplanarized devices fabricated at higher temperature. Moreover, the simulation of the device using a SPICE model is presented. 2013 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57025669010 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.1 Vol.59
title Electrical characterization of planarized a-SiGe:H Thin-film Transistors
topic Física, Astronomía y Matemáticas
low
Thin
spin
spice
on glass
url https://www.redalyc.org/articulo.oa?id=57025669010