Effects of deposition parameters on the optical and microstructural characteristics of sputtered deposited nanocrystalline ZnO thin films

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Auteur principal: D. Cornejo Monroy
Format: Artículo científico
Langue:en
Publié: Sociedad Mexicana de Física A.C. 2007
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author D. Cornejo Monroy
author_facet D. Cornejo Monroy
contents Effects of deposition parameters on the optical and microstructural characteristics of sputtered deposited nanocrystalline ZnO thin films D. Cornejo Monroy J. F. Sánchez-Ramírez M. Herrera-Zaldívar U. Pal Física, Astronomía y Matemáticas sputtering ZnO thin films microstructures optical properties Nanocrystalline ZnO thin films were deposited on silicon and quartz substrates at different working pressures and different r.f. powers to study their structural and optical properties. The films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and optical absorption spectroscopy techniques. The ZnO films were of polycrystalline nature with very small grain size. All the ZnO films were of hexagonal wurtzite structure. While the microstructural characteristics of the films depended strongly on the deposition parameters, their optical properties did not vary significantly. Films deposited at higher working pressures were of bigger grain size, irrespective of the nature of the substrate. In general, increase of r.f. power decreases the negative stress in the films. 2007 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57028299005 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.5 Vol.53
format Artículo científico
id redalyc_57028299005
institution Redalyc
language en
publishDate 2007
publisher Sociedad Mexicana de Física A.C.
spellingShingle Effects of deposition parameters on the optical and microstructural characteristics of sputtered deposited nanocrystalline ZnO thin films
D. Cornejo Monroy
Física, Astronomía y Matemáticas
sputtering
ZnO thin films
microstructures
optical properties
Effects of deposition parameters on the optical and microstructural characteristics of sputtered deposited nanocrystalline ZnO thin films D. Cornejo Monroy J. F. Sánchez-Ramírez M. Herrera-Zaldívar U. Pal Física, Astronomía y Matemáticas sputtering ZnO thin films microstructures optical properties Nanocrystalline ZnO thin films were deposited on silicon and quartz substrates at different working pressures and different r.f. powers to study their structural and optical properties. The films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and optical absorption spectroscopy techniques. The ZnO films were of polycrystalline nature with very small grain size. All the ZnO films were of hexagonal wurtzite structure. While the microstructural characteristics of the films depended strongly on the deposition parameters, their optical properties did not vary significantly. Films deposited at higher working pressures were of bigger grain size, irrespective of the nature of the substrate. In general, increase of r.f. power decreases the negative stress in the films. 2007 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57028299005 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.5 Vol.53
title Effects of deposition parameters on the optical and microstructural characteristics of sputtered deposited nanocrystalline ZnO thin films
topic Física, Astronomía y Matemáticas
sputtering
ZnO thin films
microstructures
optical properties
url https://www.redalyc.org/articulo.oa?id=57028299005