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Application of the total internal reflection phenomenon as a gas sensing technique using evaporated SnO2 thin films

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Dettagli Bibliografici
Autore principale:	L. Martínez
Natura:	Artículo científico
Lingua:	en
Pubblicazione:	Sociedad Mexicana de Física A.C. 2004
Soggetti:	Física, Astronomía y Matemáticas
Accesso online:	Acceder al recurso
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