Lock-in amplifier-based rotating-analyzer spectroscopic ellipsometer with micro-controlled angular frequency

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Bibliographic Details
Main Author:	J. M. Flores-Camacho
Format:	Artículo científico
Language:	en
Published:	Sociedad Mexicana de Física A.C. 2005
Subjects:	Física, Astronomía y Matemáticas Ellipsometers control systems dielectric function optical properties of thin films
Online Access:	Acceder al recurso 1 Acceder al recurso 2 Acceder al recurso 3 Acceder al recurso 4 Acceder al recurso 5
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