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Lock-in amplifier-based rotating-analyzer spectroscopic ellipsometer with micro-controlled angular frequency

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Détails bibliographiques
Auteur principal:	J. M. Flores-Camacho
Format:	Artículo científico
Langue:	en
Publié:	Sociedad Mexicana de Física A.C. 2005
Sujets:	Física, Astronomía y Matemáticas Ellipsometers control systems dielectric function optical properties of thin films
Accès en ligne:	Acceder al recurso 1 Acceder al recurso 2 Acceder al recurso 3 Acceder al recurso 4 Acceder al recurso 5
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