Near-field microscopy of evanescent microwaves
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| Natura: | Artículo científico |
| Lingua: | en |
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Sociedad Mexicana de Física A.C.
2005
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| _version_ | 1876466508645793792 |
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| author | V. Coello |
| author_facet | V. Coello |
| contents | Near-field microscopy of evanescent microwaves V. Coello R. Villagómez R. Cortés R. López C. Martínez Física, Astronomía y Matemáticas wave optics Scanning near microwave radiation field optical microscopy Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilitiesof the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane)scattering were elucidated. A set of two-dimensional mirrors for a local control of evanescent modes are shown along with their correspondingnear-field image, and their efficiency is discussed. We believe that the experimental approach used is reliable enough to be used as a checkof potential (two-dimensional) micro-components and possibly for micro and nano-circuits. 2005 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57064013 https://www.redalyc.org/journal/570/57064013/ https://www.redalyc.org/journal/570/57064013/html/ https://www.redalyc.org/journal/570/57064013/57064013.epub https://www.redalyc.org/journal/570/57064013/movil en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.4 Vol.51 |
| format | Artículo científico |
| id | redalyc_57064013 |
| institution | Redalyc |
| language | en |
| publishDate | 2005 |
| publisher | Sociedad Mexicana de Física A.C. |
| spellingShingle | Near-field microscopy of evanescent microwaves V. Coello Física, Astronomía y Matemáticas wave optics Scanning near microwave radiation field optical microscopy Near-field microscopy of evanescent microwaves V. Coello R. Villagómez R. Cortés R. López C. Martínez Física, Astronomía y Matemáticas wave optics Scanning near microwave radiation field optical microscopy Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilitiesof the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane)scattering were elucidated. A set of two-dimensional mirrors for a local control of evanescent modes are shown along with their correspondingnear-field image, and their efficiency is discussed. We believe that the experimental approach used is reliable enough to be used as a checkof potential (two-dimensional) micro-components and possibly for micro and nano-circuits. 2005 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57064013 https://www.redalyc.org/journal/570/57064013/ https://www.redalyc.org/journal/570/57064013/html/ https://www.redalyc.org/journal/570/57064013/57064013.epub https://www.redalyc.org/journal/570/57064013/movil en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.4 Vol.51 |
| title | Near-field microscopy of evanescent microwaves |
| topic | Física, Astronomía y Matemáticas wave optics Scanning near microwave radiation field optical microscopy |
| url | https://www.redalyc.org/articulo.oa?id=57064013 https://www.redalyc.org/journal/570/57064013/ https://www.redalyc.org/journal/570/57064013/html/ https://www.redalyc.org/journal/570/57064013/57064013.epub https://www.redalyc.org/journal/570/57064013/movil |