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| Format: | Artículo científico |
| Language: | en |
| Published: |
Sociedad Mexicana de Física A.C.
2006
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| Subjects: | |
| Online Access: | https://www.redalyc.org/articulo.oa?id=57065207 |
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Table of Contents:
- Multi-wavelength images detector for micro-cathodoluminescence analysis I. Gradilla V. Garcia M. Avalos-Borja E. Pérez-Tijerina R. Machorro O. Contreras Física, Astronomía y Matemáticas spectroscopy Cathodoluminiscence A novel instrument capable of collecting the entire cathodoluminescence emission spectrum simultaneously with SEM scanning is presentedin this work. The cathodoluminescence produced in a standard scanning electron microscope is collected and analyzed. The electronicsignal used by the microscope to trigger the electron raster and produce an image is also used by the spectrograph to synchronize spectrumacquisition. At each point in the sample the complete spectrum is acquired. All the data are recorded and saved in an electronic file. With thisinformation it is possible to reconstruct panchromatic and/or monochromatic images of the sample and correlate its optical properties withits microstructure. Instead of an elliptical mirror to collect the light in the conventional CL system, a single optical fiber is used. This newway of acquiring light permits a reduction in the work distance (down to 5 mm) in the microscope, thus achieving a better spatial resolution.Another advantage of this arrangement is that we can simultaneously use other detection modes such as backscattered electrons, x-rays etc.Examples showed here illustrate the capabilities of the instrument. 2006 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57065207 en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.4 Vol.52