Applications of the atomic force microscopy to nuclear track methodology
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| Format: | Artículo científico |
| Sprache: | en |
| Veröffentlicht: |
Sociedad Mexicana de Física A.C.
2007
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| _version_ | 1876463359595905024 |
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| author | R. Fragoso |
| author_facet | R. Fragoso |
| contents | Applications of the atomic force microscopy to nuclear track methodology R. Fragoso C. Vázquez-López J.I. Golzarri G. Espinosa Física, Astronomía y Matemáticas plastic detectors Atomic force microscopy nuclear track detectors The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in the characterization and study of nuclear tracks. Among them, conical pits on etched CR-39 exposed to alpha particles,and hillocks and/or craters on some minerals exposed to 252Cf fission fragments. Some examples of artifacts in the convolution of sampletopography and probe geometry are also mentioned. 2007 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.3 Vol.53 |
| format | Artículo científico |
| id | redalyc_57066312 |
| institution | Redalyc |
| language | en |
| publishDate | 2007 |
| publisher | Sociedad Mexicana de Física A.C. |
| spellingShingle | Applications of the atomic force microscopy to nuclear track methodology R. Fragoso Física, Astronomía y Matemáticas plastic detectors Atomic force microscopy nuclear track detectors Applications of the atomic force microscopy to nuclear track methodology R. Fragoso C. Vázquez-López J.I. Golzarri G. Espinosa Física, Astronomía y Matemáticas plastic detectors Atomic force microscopy nuclear track detectors The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of thistechnology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological featuresare very important in the characterization and study of nuclear tracks. Among them, conical pits on etched CR-39 exposed to alpha particles,and hillocks and/or craters on some minerals exposed to 252Cf fission fragments. Some examples of artifacts in the convolution of sampletopography and probe geometry are also mentioned. 2007 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.3 Vol.53 |
| title | Applications of the atomic force microscopy to nuclear track methodology |
| topic | Física, Astronomía y Matemáticas plastic detectors Atomic force microscopy nuclear track detectors |
| url | https://www.redalyc.org/articulo.oa?id=57066312 https://www.redalyc.org/journal/570/57066312/ https://www.redalyc.org/journal/570/57066312/html/ https://www.redalyc.org/journal/570/57066312/57066312.epub https://www.redalyc.org/journal/570/57066312/movil |