Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel
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Redalyc
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| Formato: | Artículo científico |
| Lenguaje: | en |
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Sociedad Mexicana de Física A.C.
2007
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| _version_ | 1876444241856561152 |
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| author | M.C. Lépy |
| author_facet | M.C. Lépy |
| contents | Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel M.C. Lépy J. Plagnard Física, Astronomía y Matemáticas metrology calibration ray spectrometry semiconductor detector In the frame of the French Metrology Institute, the Laboratoire National Henri Becquerel performs accurate characterization of semiconductordetectors that are in use in a number of applications. Their efficiency calibration, energy resolution and the detailed shape of theirresponse function are parameters of interest for accurate processing of low-energy X-ray spectra to be applied to elements identification andfundamental research studies. The tools specifically developed for low-energy detectors calibration and characterization are described, fromthe use of radioactivity standard to the development of a tunable monochromatic X-ray source. 2007 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57066316 https://www.redalyc.org/journal/570/57066316/ https://www.redalyc.org/journal/570/57066316/html/ https://www.redalyc.org/journal/570/57066316/57066316.epub https://www.redalyc.org/journal/570/57066316/movil en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.3 Vol.53 |
| format | Artículo científico |
| id | redalyc_57066316 |
| institution | Redalyc |
| language | en |
| publishDate | 2007 |
| publisher | Sociedad Mexicana de Física A.C. |
| spellingShingle | Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel M.C. Lépy Física, Astronomía y Matemáticas metrology calibration ray spectrometry semiconductor detector Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel M.C. Lépy J. Plagnard Física, Astronomía y Matemáticas metrology calibration ray spectrometry semiconductor detector In the frame of the French Metrology Institute, the Laboratoire National Henri Becquerel performs accurate characterization of semiconductordetectors that are in use in a number of applications. Their efficiency calibration, energy resolution and the detailed shape of theirresponse function are parameters of interest for accurate processing of low-energy X-ray spectra to be applied to elements identification andfundamental research studies. The tools specifically developed for low-energy detectors calibration and characterization are described, fromthe use of radioactivity standard to the development of a tunable monochromatic X-ray source. 2007 artículo científico 0035-001X https://www.redalyc.org/articulo.oa?id=57066316 https://www.redalyc.org/journal/570/57066316/ https://www.redalyc.org/journal/570/57066316/html/ https://www.redalyc.org/journal/570/57066316/57066316.epub https://www.redalyc.org/journal/570/57066316/movil en http://www.redalyc.org/revista.oa?id=570 Revista Mexicana de Física application/pdf Sociedad Mexicana de Física A.C. Revista Mexicana de Física (México) Num.3 Vol.53 |
| title | Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel |
| topic | Física, Astronomía y Matemáticas metrology calibration ray spectrometry semiconductor detector |
| url | https://www.redalyc.org/articulo.oa?id=57066316 https://www.redalyc.org/journal/570/57066316/ https://www.redalyc.org/journal/570/57066316/html/ https://www.redalyc.org/journal/570/57066316/57066316.epub https://www.redalyc.org/journal/570/57066316/movil |