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Determination of the barrier height of P t − Ir Schottky nano-contacts on Al-doped ZnO thin films by conductive Atomic Force Microscopy

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Bibliographic Details
Main Author:	J. Eduardo River L.
Format:	Artículo científico
Language:	en
Published:	Sociedad Mexicana de Física A.C. 2018
Subjects:	Física, Astronomía y Matemáticas conductive AFM Pt Schottky nano Schottky barrier height contact on ZnO thin films V Schottky characteristics
Online Access:	Acceder al recurso
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