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Physical properties of reactive RF sputtered a-IZON thin films

Fuente: Redalyc

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Detalles Bibliográficos
Autor principal:	P. Castillo-Castillo
Formato:	Artículo científico
Lenguaje:	en
Publicado:	Sociedad Mexicana de Física A.C. 2019
Materias:	Física, Astronomía y Matemáticas IZON amorphous oxynitride spectral ellipsometry Indium zinc oxynitride amorphous semiconductor
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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