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De los micrómetros a los picómetros: evolución de las técnicas de microscopía para el estudio de nanomateriales

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Bibliographic Details
Main Author:	Margarita Rivera
Format:	Artículo científico
Language:	es
Published:	Universidad Nacional Autónoma de México 2019
Subjects:	Multidisciplinaria (Ciencias Naturales y Exactas) HAADF) high resolution atomic force microscopy (AFM) magnetic force microscopy (MFM) high angle annular dark field (HR
Online Access:	Acceder al recurso
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