Trends and Volatilities in Heterogeneous Patent Quality in Taiwan
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| Natura: | Artículo científico |
| Lingua: | en |
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Universidad Alberto Hurtado
2009
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| _version_ | 1876456440522080256 |
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| author | Wen-Cheng Lu |
| author_facet | Wen-Cheng Lu |
| contents | Trends and Volatilities in Heterogeneous Patent Quality in Taiwan Wen-Cheng Lu Jong-Rong Chen I-Hsuan Tung Ingeniería Taiwan Patent trends quality patents This study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH (1,1) and asymmetric EGARCH (1,1), providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. "New design" patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH (1,1) model suitable for "new design" patent type through out of sample forecasts.management. 2009 artículo científico 0718-2724 https://www.redalyc.org/articulo.oa?id=84711432006 en http://www.redalyc.org/revista.oa?id=847 Journal of Technology Management & Innovation application/pdf Universidad Alberto Hurtado Journal of Technology Management & Innovation (Chile) Num.2 Vol.4 |
| format | Artículo científico |
| id | redalyc_84711432006 |
| institution | Redalyc |
| language | en |
| publishDate | 2009 |
| publisher | Universidad Alberto Hurtado |
| spellingShingle | Trends and Volatilities in Heterogeneous Patent Quality in Taiwan Wen-Cheng Lu Ingeniería Taiwan Patent trends quality patents Trends and Volatilities in Heterogeneous Patent Quality in Taiwan Wen-Cheng Lu Jong-Rong Chen I-Hsuan Tung Ingeniería Taiwan Patent trends quality patents This study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH (1,1) and asymmetric EGARCH (1,1), providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. "New design" patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH (1,1) model suitable for "new design" patent type through out of sample forecasts.management. 2009 artículo científico 0718-2724 https://www.redalyc.org/articulo.oa?id=84711432006 en http://www.redalyc.org/revista.oa?id=847 Journal of Technology Management & Innovation application/pdf Universidad Alberto Hurtado Journal of Technology Management & Innovation (Chile) Num.2 Vol.4 |
| title | Trends and Volatilities in Heterogeneous Patent Quality in Taiwan |
| topic | Ingeniería Taiwan Patent trends quality patents |
| url | https://www.redalyc.org/articulo.oa?id=84711432006 |