Image Analysis of Semicontinuous Metal Film
Fuente:
Redalyc
Saved in:
| Main Author: | |
|---|---|
| Format: | Artículo científico |
| Language: | en |
| Published: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
|
| Subjects: | |
| Online Access: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1876485909699887104 |
|---|---|
| author | J. Boldy |
| author_facet | J. Boldy |
| contents | Image Analysis of Semicontinuous Metal Film J. Boldy R. Hrach Física, Astronomía y Matemáticas In this paper the morphology of discontinuous metal films with irregular objects and semicontinuous films is studied by acombination of computer experimentation and image analysis of film micrographs. For the discussion of physicalmechanisms which take part during thin film growth, an atomistic model based on direct Monte Carlo simulationtechnique was performed. For the analysis of experimental photographs, as well as simulated micrographs, the basicalgorithms of mathematical morphology are used. Inadittion it is proposed a new set of features for thin film structuredescription, which are based on coefficients of Haar wavelet transform 1999 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94200908 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.9 |
| format | Artículo científico |
| id | redalyc_94200908 |
| institution | Redalyc |
| language | en |
| publishDate | 1999 |
| publisher | Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. |
| spellingShingle | Image Analysis of Semicontinuous Metal Film J. Boldy Física, Astronomía y Matemáticas Image Analysis of Semicontinuous Metal Film J. Boldy R. Hrach Física, Astronomía y Matemáticas In this paper the morphology of discontinuous metal films with irregular objects and semicontinuous films is studied by acombination of computer experimentation and image analysis of film micrographs. For the discussion of physicalmechanisms which take part during thin film growth, an atomistic model based on direct Monte Carlo simulationtechnique was performed. For the analysis of experimental photographs, as well as simulated micrographs, the basicalgorithms of mathematical morphology are used. Inadittion it is proposed a new set of features for thin film structuredescription, which are based on coefficients of Haar wavelet transform 1999 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94200908 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.9 |
| title | Image Analysis of Semicontinuous Metal Film |
| topic | Física, Astronomía y Matemáticas |
| url | https://www.redalyc.org/articulo.oa?id=94200908 |