The formation of CdTe thin films by the stacked elemental layer method
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| Format: | Artículo científico |
| Language: | en |
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Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| _version_ | 1876458264516886528 |
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| author | L.R. Cruz |
| author_facet | L.R. Cruz |
| contents | The formation of CdTe thin films by the stacked elemental layer method L.R. Cruz R.R. de Avillez Física, Astronomía y Matemáticas Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using x-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using x-ray data. The results show that the growth is diffusion controlled and the activation energy is (82 ± 2) kJ/mol. In addition, some physical properties of the films produced are reported 1999 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94200924 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.9 |
| format | Artículo científico |
| id | redalyc_94200924 |
| institution | Redalyc |
| language | en |
| publishDate | 1999 |
| publisher | Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. |
| spellingShingle | The formation of CdTe thin films by the stacked elemental layer method L.R. Cruz Física, Astronomía y Matemáticas The formation of CdTe thin films by the stacked elemental layer method L.R. Cruz R.R. de Avillez Física, Astronomía y Matemáticas Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using x-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using x-ray data. The results show that the growth is diffusion controlled and the activation energy is (82 ± 2) kJ/mol. In addition, some physical properties of the films produced are reported 1999 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94200924 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.9 |
| title | The formation of CdTe thin films by the stacked elemental layer method |
| topic | Física, Astronomía y Matemáticas |
| url | https://www.redalyc.org/articulo.oa?id=94200924 |