Rutherford Backscattering analysis of Bi-based superconducting films
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| Format: | Artículo científico |
| Langue: | en |
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Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| _version_ | 1876434097517101056 |
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| author | R. Vargas |
| author_facet | R. Vargas |
| contents | Rutherford Backscattering analysis of Bi-based superconducting films R. Vargas J.C. Cheang Wong E. Díaz Valdés A. Morales M. Jergel Física, Astronomía y Matemáticas Bi Superconductors spray pyrolysis based thin films Rutherford Backscattering The elemental composition, film thickness and concentration depth profiles of precursor and superconducting (Bi,Pb)-Sr- Ca-Cu-O films were studied by the Rutherford Backscattering Spectrometry (RBS) technique. The precursor films were deposited on MgO single-crystalline substrates from an aerosol atomized ultrasonically from an aqueous nitrate solution. Precursor films, about 5 to 5.5 mm thick, were then annealed in air at temperatures ranging from 835ºC to 855ºC during 10 h. XRD studies revealed mainly the presence of the 2212 phase (for bulk Tc is about 85 K). Films annealed at temperatures Ta ³ 850ºC were superconducting with Tc in the range of 60 to 71 K, showing a double Tc onset at 85 K and 110 K. The RBS study of the Bi-profile of precursors showed a maximum content of Bi at a depth around 1 to 2 mm from the film surface. After the film annealing, the Bi content was found to be constant from the surface to about 1 mm depth, decreasing then its value towards the film-substrate interface 1999 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94200943 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.9 |
| format | Artículo científico |
| id | redalyc_94200943 |
| institution | Redalyc |
| language | en |
| publishDate | 1999 |
| publisher | Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. |
| spellingShingle | Rutherford Backscattering analysis of Bi-based superconducting films R. Vargas Física, Astronomía y Matemáticas Bi Superconductors spray pyrolysis based thin films Rutherford Backscattering Rutherford Backscattering analysis of Bi-based superconducting films R. Vargas J.C. Cheang Wong E. Díaz Valdés A. Morales M. Jergel Física, Astronomía y Matemáticas Bi Superconductors spray pyrolysis based thin films Rutherford Backscattering The elemental composition, film thickness and concentration depth profiles of precursor and superconducting (Bi,Pb)-Sr- Ca-Cu-O films were studied by the Rutherford Backscattering Spectrometry (RBS) technique. The precursor films were deposited on MgO single-crystalline substrates from an aerosol atomized ultrasonically from an aqueous nitrate solution. Precursor films, about 5 to 5.5 mm thick, were then annealed in air at temperatures ranging from 835ºC to 855ºC during 10 h. XRD studies revealed mainly the presence of the 2212 phase (for bulk Tc is about 85 K). Films annealed at temperatures Ta ³ 850ºC were superconducting with Tc in the range of 60 to 71 K, showing a double Tc onset at 85 K and 110 K. The RBS study of the Bi-profile of precursors showed a maximum content of Bi at a depth around 1 to 2 mm from the film surface. After the film annealing, the Bi content was found to be constant from the surface to about 1 mm depth, decreasing then its value towards the film-substrate interface 1999 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94200943 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.9 |
| title | Rutherford Backscattering analysis of Bi-based superconducting films |
| topic | Física, Astronomía y Matemáticas Bi Superconductors spray pyrolysis based thin films Rutherford Backscattering |
| url | https://www.redalyc.org/articulo.oa?id=94200943 |