Influence of Si(110) misoriented substrates on the microstructure and photoreflectance of GaAs thin films deposited by MBE

Saved in:
Bibliographic Details
Main Author: M. A. Vidal
Format: Artículo científico
Language:en
Published: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 2000
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866814543907258368
author M. A. Vidal
author_facet M. A. Vidal
contents Influence of Si(110) misoriented substrates on the microstructure and photoreflectance of GaAs thin films deposited by MBE M. A. Vidal J. Luyo Alvarado M. López López M. Meléndez Lira Física, Astronomía y Matemáticas MBE Ray GaAs on Si heterostructures photoreflectance We have grown GaAs layers by molecular beam epitaxy on Si(110) substrates with different tilted angles towards the[001] direction. The samples where characterized by atomic force microscopy (AFM), high resolution x-ray diffraction(HRXRD), and photoreflectance spectroscopy (PR). The surface morphology analysis by AFM showed that the surfaceroughness decreased as the off-angle increased. The dislocation density was obtained from the full width at half maximumof the HRXRD reflection peaks. By increasing the off-angle we observed a reduction in the dislocation density. The PRspectra showed the presence of oscillations above the band-gap energy value associated to built-in internal electric fields.The built-in electric field strength and the GaAs band-gap energy values were obtained by employing the Franz-Keldyshmodel. We obtained band-gap energy values that suggest the presence of residual strains in the films 2000 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94201009 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.10
format Artículo científico
id redalyc_94201009
language en
publishDate 2000
publisher Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
spellingShingle Influence of Si(110) misoriented substrates on the microstructure and photoreflectance of GaAs thin films deposited by MBE
M. A. Vidal
Física, Astronomía y Matemáticas
MBE
Ray
GaAs on Si
heterostructures
photoreflectance
Influence of Si(110) misoriented substrates on the microstructure and photoreflectance of GaAs thin films deposited by MBE M. A. Vidal J. Luyo Alvarado M. López López M. Meléndez Lira Física, Astronomía y Matemáticas MBE Ray GaAs on Si heterostructures photoreflectance We have grown GaAs layers by molecular beam epitaxy on Si(110) substrates with different tilted angles towards the[001] direction. The samples where characterized by atomic force microscopy (AFM), high resolution x-ray diffraction(HRXRD), and photoreflectance spectroscopy (PR). The surface morphology analysis by AFM showed that the surfaceroughness decreased as the off-angle increased. The dislocation density was obtained from the full width at half maximumof the HRXRD reflection peaks. By increasing the off-angle we observed a reduction in the dislocation density. The PRspectra showed the presence of oscillations above the band-gap energy value associated to built-in internal electric fields.The built-in electric field strength and the GaAs band-gap energy values were obtained by employing the Franz-Keldyshmodel. We obtained band-gap energy values that suggest the presence of residual strains in the films 2000 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94201009 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.10
title Influence of Si(110) misoriented substrates on the microstructure and photoreflectance of GaAs thin films deposited by MBE
topic Física, Astronomía y Matemáticas
MBE
Ray
GaAs on Si
heterostructures
photoreflectance
url https://www.redalyc.org/articulo.oa?id=94201009