Structural and optical characterization of screen-printed CdSxTe1-x films
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| Format: | Artículo científico |
| Language: | en |
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Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2000
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| _version_ | 1876444936410234880 |
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| author | M. Meléndez |
| author_facet | M. Meléndez |
| contents | Structural and optical characterization of screen-printed CdSxTe1-x films M. Meléndez M. A. Santana L. Escobar Física, Astronomía y Matemáticas CdS CdTe CdSxTe1 Screen printing Semiconductor alloys We present results of a study on the electronic and structural properties of screen-printed CdSxTe1-x films. Nominalsulphur concentrations (x) at mol% were prepared in all the compositional range by mixing CdS and CdTe powders,CdCl2 was added as a flux. The mixtures were screen-printed and then re-crystallized by solid phase or pulsed lasermethods. The employed characterization techniques were x-ray diffraction, scanning electron microscopy (SEM) andoptical transmission. From x-ray diffractograms we conclude that single-phase mixtures in the ranges 0-29 mol% (CdTelike)and 97-100 mol% (CdS-like) were obtained. Samples with nominal composition different of the above mentionedranges presented both zincblende and wurzite phases. The band gap energy as obtained from transmission measurementsdecreases as sulphur concentration increases in the tellurium-rich branch. After x = 0.12 and up to x = 0.95 the band gapremains constant and then increases with sulphur concentration. Obtained results showed a saturation effect in the rangeof nominal compositions 0.29 £ x £ 0.95 2000 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94201010 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.10 |
| format | Artículo científico |
| id | redalyc_94201010 |
| institution | Redalyc |
| language | en |
| publishDate | 2000 |
| publisher | Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. |
| spellingShingle | Structural and optical characterization of screen-printed CdSxTe1-x films M. Meléndez Física, Astronomía y Matemáticas CdS CdTe CdSxTe1 Screen printing Semiconductor alloys Structural and optical characterization of screen-printed CdSxTe1-x films M. Meléndez M. A. Santana L. Escobar Física, Astronomía y Matemáticas CdS CdTe CdSxTe1 Screen printing Semiconductor alloys We present results of a study on the electronic and structural properties of screen-printed CdSxTe1-x films. Nominalsulphur concentrations (x) at mol% were prepared in all the compositional range by mixing CdS and CdTe powders,CdCl2 was added as a flux. The mixtures were screen-printed and then re-crystallized by solid phase or pulsed lasermethods. The employed characterization techniques were x-ray diffraction, scanning electron microscopy (SEM) andoptical transmission. From x-ray diffractograms we conclude that single-phase mixtures in the ranges 0-29 mol% (CdTelike)and 97-100 mol% (CdS-like) were obtained. Samples with nominal composition different of the above mentionedranges presented both zincblende and wurzite phases. The band gap energy as obtained from transmission measurementsdecreases as sulphur concentration increases in the tellurium-rich branch. After x = 0.12 and up to x = 0.95 the band gapremains constant and then increases with sulphur concentration. Obtained results showed a saturation effect in the rangeof nominal compositions 0.29 £ x £ 0.95 2000 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94201010 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.10 |
| title | Structural and optical characterization of screen-printed CdSxTe1-x films |
| topic | Física, Astronomía y Matemáticas CdS CdTe CdSxTe1 Screen printing Semiconductor alloys |
| url | https://www.redalyc.org/articulo.oa?id=94201010 |