Skip to content
VuFind
  • Login
    • English
    • Deutsch
    • Español
    • Français
    • Italiano
Advanced
  • Cite this
  • Text this
  • Email this
  • Print
  • Export Record
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
  • Save to List
  • Permanent link
Cover Image

Saved in:
Bibliographic Details
Main Author: P. Bartolo-Pérez
Format: Artículo científico
Language:en
Published: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 1999
Subjects:
Física, Astronomía y Matemáticas
CdTe compounds
Auger spectroscopy
atomic concentration
sensisitivity factors
Online Access:https://www.redalyc.org/articulo.oa?id=94211324013
Tags: Add Tag
No Tags, Be the first to tag this record!
  • Holdings
  • Description
  • Table of Contents
  • Comments
  • Similar Items
  • Staff View

Internet

https://www.redalyc.org/articulo.oa?id=94211324013

Similar Items

  • XPS analysis of oxidation states of Te in CdTe oxide films grown by rf sputtering with an Ar -NH3 plasma
    by: P. Bartolo Pérez
    Published: (2001)
  • MBE growth of CdTe epilayers on InSb(111) substrates
    by: J. Huerta
    Published: (1999)
  • Estudio comparativo de la degradación de celdas solares de CdTe con CdS procesado por CBD y CSVT
    by: R. Mendoza-Pérez
    Published: (2012)
  • Study of CdTe recrystallization by hydrated-CdCl2 thermal treatment
    by: C. Hernandez Vasquez
    Published: (2017)
  • Structural and optical characterization of screen-printed CdSxTe1-x films
    by: M. Meléndez
    Published: (2000)

Search Options

  • Search History
  • Advanced Search

Find More

  • Browse the Catalog
  • Browse Alphabetically
  • Explore Channels
  • Course Reserves
  • New Items

Need Help?

  • Search Tips
  • Ask a Librarian
  • FAQs