Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation
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| Format: | Artículo científico |
| Langue: | en |
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Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2003
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| _version_ | 1876467954465374208 |
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| author | F. Rojas |
| author_facet | F. Rojas |
| contents | Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation F. Rojas C. Calderón G. Gordillo Física, Astronomía y Matemáticas Te1 CdSx Thin films Solar cells Optical constants Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterizedthrough spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants weredetermined by simple straightforward calculations using the transmission spectrum alone.From x-ray diffraction measurements and data of the chemical composition obtained from x-ray fluorescencemeasurements, is shown that thin films of CdSxTe1-x mixed crystals with any composition can be obtained by this method 2003 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94216306 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.3 Vol.16 |
| format | Artículo científico |
| id | redalyc_94216306 |
| institution | Redalyc |
| language | en |
| publishDate | 2003 |
| publisher | Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. |
| spellingShingle | Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation F. Rojas Física, Astronomía y Matemáticas Te1 CdSx Thin films Solar cells Optical constants Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation F. Rojas C. Calderón G. Gordillo Física, Astronomía y Matemáticas Te1 CdSx Thin films Solar cells Optical constants Polycrystalline CdSx,Te1-x thin films, grown on glass substrates by co-evaporation of CdS and CdTe were characterizedthrough spectral transmittance and x-ray diffraction measurements. The film thickness d and the optical constants weredetermined by simple straightforward calculations using the transmission spectrum alone.From x-ray diffraction measurements and data of the chemical composition obtained from x-ray fluorescencemeasurements, is shown that thin films of CdSxTe1-x mixed crystals with any composition can be obtained by this method 2003 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94216306 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.3 Vol.16 |
| title | Optical characterization of Cd(Sx,Te1-x) thin films deposited by evaporation |
| topic | Física, Astronomía y Matemáticas Te1 CdSx Thin films Solar cells Optical constants |
| url | https://www.redalyc.org/articulo.oa?id=94216306 |