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Bibliographic Details
Main Author: Yu Zhenrui
Format: Artículo científico
Language:en
Published: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 2003
Subjects:
Física, Astronomía y Matemáticas
Charge trapping
CV measurements
Si nanocrystals
Silicon rich oxide
Lateral electrical stress
Online Access:https://www.redalyc.org/articulo.oa?id=94216406
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https://www.redalyc.org/articulo.oa?id=94216406

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