Characterization by photoreflectance of Eo´ and E1 silicon-like critical points in ion implanted Si1-yCy thin films

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Bibliographic Details
Main Author: M. Melendez-Lira
Format: Artículo científico
Language:en
Published: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 2005
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