Infrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation
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| Format: | Artículo científico |
| Langue: | en |
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Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2005
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| _version_ | 1876476097856536576 |
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| author | L. Escobar-Alarcón |
| author_facet | L. Escobar-Alarcón |
| contents | Infrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation L. Escobar-Alarcón A. Arrieta E. Camps S. Romero M. A. Camacho-Lopez Física, Astronomía y Matemáticas Laser ablation Carbon nitride Raman spectroscopy Infrared spectroscopy Infrared and Raman spectroscopies have been used to characterize the presence of sp2 and sp3 bonds in carbon nitride films providing some information about the sp2/sp3 ratio. The Raman results revealed that the increase in size or number of sp2 clusters is the result of two processes, which include the increase of nitrogen content and particle bombardment, so that under certain experimental conditions a film with practically the same composition but different microstructure can be obtained. IR results reveal the presence of carbon-carbon, carbon-nitrogen, carbon-oxygen and carbon-hydrogen bonding, and their intensities depend on the laser fluence used for deposition. 2005 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94218303 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.3 Vol.18 |
| format | Artículo científico |
| id | redalyc_94218303 |
| institution | Redalyc |
| language | en |
| publishDate | 2005 |
| publisher | Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. |
| spellingShingle | Infrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation L. Escobar-Alarcón Física, Astronomía y Matemáticas Laser ablation Carbon nitride Raman spectroscopy Infrared spectroscopy Infrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation L. Escobar-Alarcón A. Arrieta E. Camps S. Romero M. A. Camacho-Lopez Física, Astronomía y Matemáticas Laser ablation Carbon nitride Raman spectroscopy Infrared spectroscopy Infrared and Raman spectroscopies have been used to characterize the presence of sp2 and sp3 bonds in carbon nitride films providing some information about the sp2/sp3 ratio. The Raman results revealed that the increase in size or number of sp2 clusters is the result of two processes, which include the increase of nitrogen content and particle bombardment, so that under certain experimental conditions a film with practically the same composition but different microstructure can be obtained. IR results reveal the presence of carbon-carbon, carbon-nitrogen, carbon-oxygen and carbon-hydrogen bonding, and their intensities depend on the laser fluence used for deposition. 2005 artículo científico 1665-3521 https://www.redalyc.org/articulo.oa?id=94218303 en http://www.redalyc.org/revista.oa?id=942 Superficies y vacío application/pdf Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Superficies y vacío (México) Num.3 Vol.18 |
| title | Infrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation |
| topic | Física, Astronomía y Matemáticas Laser ablation Carbon nitride Raman spectroscopy Infrared spectroscopy |
| url | https://www.redalyc.org/articulo.oa?id=94218303 |