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Influence of active layer thickness, device architecture and degradation effects on the contact resistance in organic thin film transistor

Fuente: Redalyc

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Dettagli Bibliografici
Autore principale:	C.A. Pons-Flores
Natura:	Artículo científico
Lingua:	en
Pubblicazione:	Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 2017
Soggetti:	Física, Astronomía y Matemáticas
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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