Technical note: Minimizing CIED artifacts on a 0.35 T MRI‐Linac using deep learning

Fuente: Wiley Open Access
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Bibliographic Details
Main Authors: Austen N. Curcuru, Deshan Yang, Hongyu An, Phillip S. Cuculich, Clifford G. Robinson, H. Michael Gach
Format: Artículo Open Access
Published: Wiley 2024
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