CNN‐based defect detection in manufacturing

Fuente: Wiley Open Access

Saved in:

Bibliographic Details
Main Authors:	Ming Hou, Pengcheng Li, Shiqi Cheng, Jingyao Yv
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	Advanced Control for Applications
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet