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CNN‐based defect detection in manufacturing
CNN‐based defect detection in manufacturing
Fuente:
Wiley Open Access
Saved in:
Bibliographic Details
Main Authors:
Ming Hou
,
Pengcheng Li
,
Shiqi Cheng
,
Jingyao Yv
Format:
Artículo Open Access
Published:
Wiley
2024
Subjects:
Advanced Control for Applications
Online Access:
Acceder al recurso
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