Natural van der Waals Canalization Lens for Non‐Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Qingdong Ou, Shuwen Xue, Weiliang Ma, Jiong Yang, Guangyuan Si, Lu Liu, Gang Zhong, Jingying Liu, Zongyuan Xie, Ying Xiao, Tian Sun, Ding Yuan, Kourosh Kalantar‐Zadeh, Peining Li, Zhigao Dai, Huanyang Chen, Qiaoliang Bao
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	Advanced Materials
Online Access:	Acceder al recurso
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