In‐situ p‐Doping of Nanometer Tellurium‐based Oxide for Room‐Temperature CMOS Circuits

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Main Authors: Mengfei He, Hamin Choi, Zhikai Le, Xiaomin Yang, Yanlin Huang, Youjin Reo, Sai Bai, Mingyang Wang, Huihui Zhu, Yong‐Young Noh, Ao Liu
Format: Artículo Open Access
Published: Wiley 2026
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_version_ 1867009352655699968
author Mengfei He
Hamin Choi
Zhikai Le
Xiaomin Yang
Yanlin Huang
Youjin Reo
Sai Bai
Mingyang Wang
Huihui Zhu
Yong‐Young Noh
Ao Liu
author_facet Mengfei He
Hamin Choi
Zhikai Le
Xiaomin Yang
Yanlin Huang
Youjin Reo
Sai Bai
Mingyang Wang
Huihui Zhu
Yong‐Young Noh
Ao Liu
Mengfei He
Hamin Choi
Zhikai Le
Xiaomin Yang
Yanlin Huang
Youjin Reo
Sai Bai
Mingyang Wang
Huihui Zhu
Yong‐Young Noh
Ao Liu
collection Wiley Open Access
contents In‐situ p‐Doping of Nanometer Tellurium‐based Oxide for Room‐Temperature CMOS Circuits Mengfei He Hamin Choi Zhikai Le Xiaomin Yang Yanlin Huang Youjin Reo Sai Bai Mingyang Wang Huihui Zhu Yong‐Young Noh Ao Liu Advanced Materials ABSTRACT The development of high‐performance p ‐type oxide semiconductors is crucial for scalable CMOS technologies, yet conventional oxides remain intrinsically difficult to p‐dope owing to the localized nature of oxygen orbitals and strong defect compensation. Here, we report a reaction‐metal‐mediated redox strategy that exploits the deposition environment for intrinsic in situ p ‐type doping of tellurium oxide. Mo‐assisted reduction produces nanometer Te‐based oxide films with tunable Te nanochannels, which form percolative pathways that markedly enhance hole transport. Remarkably, films deposited at room temperature (RT) achieve mobilities above 10 cm 2 V −1 s −1 and carrier densities tunable over more than five orders of magnitude. Co‐integration with n ‐type oxide transistors enables the fabrication of all‐oxide CMOS circuits entirely at RT with robust logic functionality. This intrinsically regulated doping pathway provides a generalizable route to overcome long‐standing bottlenecks in p ‐type oxides and advance oxide semiconductors toward large‐area, flexible CMOS electronics. 10.1002/adma.72813 http://onlinelibrary.wiley.com/termsAndConditions#vor
doi_str_mv 10.1002/adma.72813
format Artículo Open Access
id wiley_oa_10_1002_adma_72813
institution Wiley Open Access
license_str_mv http://onlinelibrary.wiley.com/termsAndConditions#vor
publishDate 2026
publisher Wiley
record_format wiley_oa
spellingShingle In‐situ p‐Doping of Nanometer Tellurium‐based Oxide for Room‐Temperature CMOS Circuits
Mengfei He
Hamin Choi
Zhikai Le
Xiaomin Yang
Yanlin Huang
Youjin Reo
Sai Bai
Mingyang Wang
Huihui Zhu
Yong‐Young Noh
Ao Liu
Advanced Materials
In‐situ p‐Doping of Nanometer Tellurium‐based Oxide for Room‐Temperature CMOS Circuits Mengfei He Hamin Choi Zhikai Le Xiaomin Yang Yanlin Huang Youjin Reo Sai Bai Mingyang Wang Huihui Zhu Yong‐Young Noh Ao Liu Advanced Materials ABSTRACT The development of high‐performance p ‐type oxide semiconductors is crucial for scalable CMOS technologies, yet conventional oxides remain intrinsically difficult to p‐dope owing to the localized nature of oxygen orbitals and strong defect compensation. Here, we report a reaction‐metal‐mediated redox strategy that exploits the deposition environment for intrinsic in situ p ‐type doping of tellurium oxide. Mo‐assisted reduction produces nanometer Te‐based oxide films with tunable Te nanochannels, which form percolative pathways that markedly enhance hole transport. Remarkably, films deposited at room temperature (RT) achieve mobilities above 10 cm 2 V −1 s −1 and carrier densities tunable over more than five orders of magnitude. Co‐integration with n ‐type oxide transistors enables the fabrication of all‐oxide CMOS circuits entirely at RT with robust logic functionality. This intrinsically regulated doping pathway provides a generalizable route to overcome long‐standing bottlenecks in p ‐type oxides and advance oxide semiconductors toward large‐area, flexible CMOS electronics. 10.1002/adma.72813 http://onlinelibrary.wiley.com/termsAndConditions#vor
title In‐situ p‐Doping of Nanometer Tellurium‐based Oxide for Room‐Temperature CMOS Circuits
topic Advanced Materials
url https://advanced.onlinelibrary.wiley.com/doi/10.1002/adma.72813