Electron‐Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer‐Scale and In‐Line Compatible Electrical Characterization of 2D Materials (Adv. Sci. 44/2025)

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Md Ashiqur Rahman Laskar, Sakib Ahmed, Pinakapani Tummala, Alessandro Molle, Alessio Lamperti, Renee Sailus, Youssry Y Botros, Milan Pesic, Rob Davenport, Ondřej Novotný, Jan Neuman, Fabrizio Toia, Ivan Sanchez Esqueda, Seth Ariel Tongay, Umberto Celano
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	Advanced Science
Online Access:	Acceder al recurso
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