Characteristic parameter model and circuit‐level simulation of gate‐controlled dual direction SCR for on‐chip ESD protection

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	Yujie Liu, Yang Wang, Jian Yang, Xiangliang Jin
Format:	Artículo Open Access
Published:	Wiley 2024
Subjects:	International Journal of Circuit Theory and Applications
Online Access:	Acceder al recurso
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