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Junction temperature monitoring of silicon carbide MOSFET based on turn‐off voltage spike

Fuente: Wiley Open Access

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Détails bibliographiques
Auteurs principaux:	Xinbo Liu, Bo Liu, Shuiyuan He, Lijian Diao, Lijun Diao
Format:	Artículo Open Access
Publié:	Wiley 2024
Sujets:	International Journal of Circuit Theory and Applications
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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