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A Low‐Power Triple‐Node‐Upset Recovery Hardened Latch Based on Triple Modular Redundancy

Fuente: Wiley Open Access

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Dettagli Bibliografici
Autori principali:	Hui Xu, Chuanjian Zhang, Ruijun Ma, Zhengfeng Huang, Shengnan Ye, Haifeng Sun, Yue Dai, Xin Chen, Ye Tang
Natura:	Artículo Open Access
Pubblicazione:	Wiley 2025
Soggetti:	International Journal of Circuit Theory and Applications
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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