The Development of an Alternative Methodology to Measure the Particle Size Allowed Passing Through Face Masks Using a Scanning Electron Microscopy

Fuente: Wiley Open Access

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Bibliographic Details
Main Authors:	J. Arenas‐Alatorre, S. Tehuacanero Cuapa, C. Magaña‐Zavala, Cecilia Noguez
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	Microscopy Research and Technique
Online Access:	Acceder al recurso
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