Impact of Rapid Thermal Processing on Bulk Lifetime and Surface Recombination Velocity of Crystalline Silicon With Passivating Tunnel Oxide Contacts

Fuente: Wiley Open Access
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Bibliographic Details
Main Authors: F.‐J. Haug, A. Morisset, M. Lehmann, S. Libraro, E. Genç, J. Hurni, C. Ballif
Format: Artículo Open Access
Published: Wiley 2025
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